@article{GUO2025, 
author = {Zhongjie GUO and Hu LU and Nan LIU and Longsheng WU},
title = {Total ionizing dose effect analysis and radiation hardening design method of Buck-Boost converter},
year = {2025},
journal = {Journal of Beijing University of Aeronautics and Astronautics},
volume = {51},
number = {2},
pages = {389-396},
keywords = {total ionizing dose effect, hardening design, Buck-Boost converter, error amplifier, real-time monitoring},
url = {https://www.sciopen.com/article/10.13700/j.bh.1001-5965.2023.0050},
doi = {10.13700/j.bh.1001-5965.2023.0050},
abstract = {DC-DC converter in the total dose radiation environment will mainly bring the output voltage drift, linear adjustment rate load adjustment rate decline and other effects so that the output stability performance of the circuit deteriorates. In order to address the issues with the conventional total ionizing dose effect hardening method that stem from process and layout, including high cost, large layout area, and poor universality, this paper suggests a total ionizing dose effect hardening design method with parallel monitoring and hardening. This method can accomplish total ionizing dose effect hardening at the circuit level without the need for a process. The anti-total dose capability of the Buck-Boost converter is improved. The circuit design and physical implementation of the proposed method are verified based on the 0.18 μm BCD process. According to the findings, with a dosage of 2000 Gy (Si), it is possible to enhance the output voltage shift rate from 0.0663% to 0.0074% and compensate the system gain drop rate from 19.26% to 6.65%. The load adjustment rate and linear adjustment rate are reduced by 2.15%/A and 0.0389%/V, respectively, which provides a new idea for the design of total ionizing dose effect hardening at the circuit and system level.}
}