@article{Zou2022, 
author = {Bo Zou and Yu Zhou and Yan Zhou and Yanyan Wu and Yang He and Xiaonan Wang and Jinfeng Yang and Lianghui Zhang and Yuxiang Chen and Shi Zhou and Huaixin Guo and Huarui Sun},
title = {Reliable and broad-range layer identification of Au-assisted exfoliated large area MoS2 and WS2 using reflection spectroscopic fingerprints},
year = {2022},
journal = {Nano Research},
volume = {15},
number = {9},
pages = {8470-8478},
keywords = {Au-assisted exfoliation, MoS2 and WS2, layer identification, white light reflection spectra, excitonic peaks},
url = {https://www.sciopen.com/article/10.1007/s12274-022-4418-z},
doi = {10.1007/s12274-022-4418-z},
abstract = {The emerging Au-assisted exfoliation technique enables the production of a wealth of large-area and high-quality ultrathin two dimensional (2D) crystals. Fast, damage-free, and reliable determination of the layer number of such 2D films can greatly promote layer-dependent physical studies and device applications. Here, an optical method has been developed for simple, high throughput, and accurate determination of the layer number for Au-assisted exfoliated MoS2 and WS2 films in a broad thickness range. The method is based on quantitative analysis of layer-dependent white light reflection spectra (WLRS), revealing that the intensity of exciton-induced reflection peaks can be used as a clear indicator for identifying the layer number. The simple yet robust method will facilitate fundamental studies on layer-dependent optical, electrical, and thermal properties and device applications of 2D materials. The technique can also be readily combined with photoluminescence (PL) and Raman spectroscopies to study other layer-dependent physical properties of 2D materials.}
}