TY  - JOUR
AU  - Zou, Bo
AU  - Zhou, Yu
AU  - Zhou, Yan
AU  - Wu, Yanyan
AU  - He, Yang
AU  - Wang, Xiaonan
AU  - Yang, Jinfeng
AU  - Zhang, Lianghui
AU  - Chen, Yuxiang
AU  - Zhou, Shi
AU  - Guo, Huaixin
AU  - Sun, Huarui
PY  - 2022
TI  - Reliable and broad-range layer identification of Au-assisted exfoliated large area MoS2 and WS2 using reflection spectroscopic fingerprints
JO  - Nano Research
SN  - 1998-0124
SP  - 8470
EP  - 8478
VL  - 15
IS  - 9
AB  - The emerging Au-assisted exfoliation technique enables the production of a wealth of large-area and high-quality ultrathin two dimensional (2D) crystals. Fast, damage-free, and reliable determination of the layer number of such 2D films can greatly promote layer-dependent physical studies and device applications. Here, an optical method has been developed for simple, high throughput, and accurate determination of the layer number for Au-assisted exfoliated MoS2 and WS2 films in a broad thickness range. The method is based on quantitative analysis of layer-dependent white light reflection spectra (WLRS), revealing that the intensity of exciton-induced reflection peaks can be used as a clear indicator for identifying the layer number. The simple yet robust method will facilitate fundamental studies on layer-dependent optical, electrical, and thermal properties and device applications of 2D materials. The technique can also be readily combined with photoluminescence (PL) and Raman spectroscopies to study other layer-dependent physical properties of 2D materials.
UR  - https://doi.org/10.1007/s12274-022-4418-z
DO  - 10.1007/s12274-022-4418-z