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This study presents the photoluminescence characteristics of the PZT 53/47 system doped at A and/or B sites, with Nb (PZTN), La (PLZT), and Nb–La (PLZTN) in the concentration range from 0.2 to 1.0 molar fraction. The intensity of the emission bands of the system PZTN is two orders higher than the intensity of the emission bands of the systems PLZT and PLZTN, and these emission bands are located at 1.73 eV (718 nm), 2.56 eV (485 nm), and 2.93 eV (424 nm). The origin of the luminescence in these systems is associated with lead and oxygen vacancies produced during the sintering process. The results from X-ray diffraction (XRD) show a mixture of rhombohedral and tetragonal phases. The system PZTN shows a higher tetragonal phase concentration, while PLZT and PLZTN systems show a higher rhombohedral phase concentration. The cell volume shows an increase with dopant concentration only in the case of the PLZTN system. The band gap energy shows a small variation in the PZTN and PLZTN cases around 3.0 eV, a close value to the band gap energy of the pure PZT 53/47 sample. The system PLZT shows an increasing behavior until 4.41 eV for the higher dopant concentration.


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Photoluminescence characteristics of soft PZT 53/47 ceramic doped at A and/or B sites

Show Author's information M. D. DURRUTHY-RODRÍGUEZa,bJ. J. GERVACIO-ARCINIEGAcM. HERNÁNDEZ-GARCÍAa,bJ. M. YÁÑEZ-LIMÓNd( )
Universidad Nacional Evangélica, Calle Libertador No. 18, San Carlos, Santo Domingo, Distrito Nacional, CP 10203, República Dominicana
Departamento de Física Aplicada, Instituto de Cibernética, Matemática y Física, CITMA, 15 # 551, Vedado, La Habana, CP 10400, Cuba
Catedrático CONACYT-Facultad de Ciencias Físico Matemáticas, Benemérita Universidad Autónoma de Puebla, AP 1152, Puebla, Pue., 72000, México
CINVESTAV-Unidad Querétaro del IPN, Libramiento Norponiente 2000, Fracc. Real de Juriquilla, CP 76230, Santiago de Querétaro, Querétaro, México

Abstract

This study presents the photoluminescence characteristics of the PZT 53/47 system doped at A and/or B sites, with Nb (PZTN), La (PLZT), and Nb–La (PLZTN) in the concentration range from 0.2 to 1.0 molar fraction. The intensity of the emission bands of the system PZTN is two orders higher than the intensity of the emission bands of the systems PLZT and PLZTN, and these emission bands are located at 1.73 eV (718 nm), 2.56 eV (485 nm), and 2.93 eV (424 nm). The origin of the luminescence in these systems is associated with lead and oxygen vacancies produced during the sintering process. The results from X-ray diffraction (XRD) show a mixture of rhombohedral and tetragonal phases. The system PZTN shows a higher tetragonal phase concentration, while PLZT and PLZTN systems show a higher rhombohedral phase concentration. The cell volume shows an increase with dopant concentration only in the case of the PLZTN system. The band gap energy shows a small variation in the PZTN and PLZTN cases around 3.0 eV, a close value to the band gap energy of the pure PZT 53/47 sample. The system PLZT shows an increasing behavior until 4.41 eV for the higher dopant concentration.

Keywords: photoluminescence, X-ray diffraction (XRD), PZT ceramics, band structure

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Publication history
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Publication history

Received: 12 October 2017
Revised: 18 January 2018
Accepted: 29 January 2018
Published: 09 March 2018
Issue date: June 2018

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© The author(s) 2018

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